2904 search results - page 341 / 581 » Valuing Design Repair |
175
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HICSS
2008
IEEE
16 years 28 days ago
2008
IEEE
Collaboration Engineering (CE) projects can run for months and can require substantial expenditures of effort and resources. CE is an approach to designing collaborative work prac...
178
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HPCA
2008
IEEE
16 years 28 days ago
2008
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
193
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INFOCOM
2008
IEEE
16 years 27 days ago
2008
IEEE
Abstract—We present a framework for designing delayindependent end-to-end congestion control algorithms, where each end-user may have a different utility function. We only requir...
165
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ISVLSI
2008
IEEE
16 years 26 days ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
137
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ECBS
2007
IEEE
16 years 25 days ago
2007
IEEE
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can ...