2904 search results - page 315 / 581 » Valuing Design Repair |
154
click to vote
ASPDAC
2008
ACM
15 years 8 months ago
2008
ACM
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
180
click to vote
CSSE
2008
IEEE
15 years 8 months ago
2008
IEEE
Based on the analysis of color histogram for image retrieval, a new descriptor, bit-plane distribution entropy (BPDE), is proposed in this paper. The image is firstly divided into ...
157
click to vote
DIS
2008
Springer
15 years 8 months ago
2008
Springer
Abstract. An important task in many scientific and engineering disciplines is to set up experiments with the goal of finding the best instances (substances, compositions, designs) ...
161
click to vote
COMAD
2008
15 years 8 months ago
2008
Orion is a state-of-the-art uncertain database management system that extends the relational model to include probabilistic uncertain data as first call data types. This demonstra...
168
click to vote
GRAPHICSINTERFACE
2008
15 years 8 months ago
2008
Effective mode-switching techniques provide users of tablet interfaces with access to a rich set of behaviors. While many researchers have studied the relative performance of mode...