2449 search results - page 159 / 490 » VLSI |
145
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VLSID
2006
IEEE
16 years 15 days ago
2006
IEEE
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
147
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GLVLSI
2005
IEEE
16 years 3 days ago
2005
IEEE
The ever-increasing number of transistors on a chip has resulted in very large scale integration (VLSI) systems whose performance and manufacturing costs are driven by on-chip wir...
116
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DFT
2003
IEEE
15 years 11 months ago
2003
IEEE
Over the last years, an increasing number of safety-critical tasks have been demanded to computer systems. In this paper, a software-based approach for developing safety-critical
159
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GLVLSI
2003
IEEE
15 years 11 months ago
2003
IEEE
Octagonal Steiner Minimal Trees (OSMTs) are used in the global routing phase of pervasive octagonal VLSI layout. The OSMT problem seeks a minimal length spanning structure using e...