We propose a new fault localization technique for software bugs in large-scale computing systems. Our technique always collects per-process function call traces of a target system...
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
— Non-negative matrix factorization (NMF), i.e. V ≈ WH where both V, W and H are non-negative has become a widely used blind source separation technique due to its part based r...
—The potential for improving the performance of data-intensive scientific programs by enhancing data reuse in cache is substantial because CPUs are significantly faster than me...
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...