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157
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
164
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MICCAI
2007
Springer
16 years 7 months ago
2007
Springer
Abstract. An important issue in electroencephalographiy (EEG) experiments is to measure accurately the three dimensional (3D) positions of the electrodes. We propose a system where...
196
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MICCAI
2003
Springer
16 years 7 months ago
2003
Springer
Abstract. When developing statistical models of normal brain perfusion, two questions are of crucial interest: How well does an atlas describe normality and how sensitive is it at ...
154
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ICML
2009
IEEE
16 years 7 months ago
2009
IEEE
Information theoretic based measures form a fundamental class of similarity measures for comparing clusterings, beside the class of pair-counting based and set-matching based meas...
161
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ICML
2005
IEEE
16 years 7 months ago
2005
IEEE
We empirically study the relationship between supervised and multiple instance (MI) learning. Algorithms to learn various concepts have been adapted to the MI representation. Howe...