7991 search results - page 470 / 1599 » Using More Reasoning to Improve |
172
click to vote
MICCAI
2001
Springer
15 years 11 months ago
2001
Springer
In this article we merge point feature and intensity-based registration in a single algorithm to tackle the problem of multiple brain registration. Because of the high variability ...
179
click to vote
ICCAD
2000
IEEE
15 years 11 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
187
click to vote
DAC
1999
ACM
15 years 11 months ago
1999
ACM
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
182
click to vote
SI3D
1999
ACM
15 years 11 months ago
1999
ACM
This paper presents a framework that uses the outputs of model simplification to guide the construction of bounding volume hierarchies for use in, for example, collision detection...
187
click to vote
VLSID
1999
IEEE
15 years 11 months ago
1999
IEEE
The design and synthesis of asynchronous circuits is gaining importance in both the industrial and academic worlds. Timed circuits are a class of asynchronous circuits that incorp...