1227 search results - page 116 / 246 » Using Generation for Grammar Analysis and Error Detection |
183
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
148
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BMCBI
2008
15 years 6 months ago
2008
Background: In addition to their use in detecting undesired real-time PCR products, melting temperatures are useful for detecting variations in the desired target sequences. Metho...
192
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KBSE
2005
IEEE
15 years 11 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
147
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ECOOP
2006
Springer
15 years 10 months ago
2006
Springer
Templates are a powerful but poorly understood feature of the C++ language. Their syntax resembles the parameterized classes of other languages (e.g., of Java). But because C++ sup...
135
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DAC
1996
ACM
15 years 10 months ago
1996
ACM
Abstract-- It is impractical to verify multiplier or divider circuits entirely at the bit-level using ordered Binary Decision Diagrams (BDDs), because the BDD representations for t...