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DATE
2006
IEEE
75views Hardware» more  DATE 2006»
16 years 27 days ago
Space of DRAM fault models and corresponding testing
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...
Zaid Al-Ars, Said Hamdioui, A. J. van de Goor
ICASSP
2009
IEEE
16 years 1 months ago
Visual saliency with side information
We propose novel algorithms for organizing large image and video datasets using both the visual content and the associated sideinformation, such as time, location, authorship, and...
Wei Jiang, Lexing Xie, Shih-Fu Chang
IEEEAMS
2003
IEEE
16 years 3 days ago
JAGR: An Autonomous Self-Recovering Application Server
This paper demonstrates that the dependability of generic, evolving J2EE applications can be enhanced through a combination of a few recovery-oriented techniques. Our goal is to r...
George Candea, Emre Kiciman, Steve Zhang, Pedram K...
HIPC
1999
Springer
15 years 11 months ago
High Performance Data Mining
Abstract. Recent times have seen an explosive growth in the availability of various kinds of data. It has resulted in an unprecedented opportunity to develop automated data-driven ...
Vipin Kumar, Jaideep Srivastava
CASES
2003
ACM
16 years 2 days ago
Clustered calculation of worst-case execution times
Knowing the Worst-Case Execution Time (WCET) of a program is necessary when designing and verifying real-time systems. A correct WCET analysis method must take into account the po...
Andreas Ermedahl, Friedhelm Stappert, Jakob Engblo...