Many engineers are still reluctant to adopt advanced object-oriented technologies (such as high modularity, dynamic binding, automatic garbage collection, etc.) for embedded syste...
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
This paper describes a new collaboration technology that is based on the support of lightweight, informally structured, opportunistic activities featuring heterogeneous threads of...
David R. Millen, Michael J. Muller, Werner Geyer, ...
The concept of design patterns has recently emerged as a new paradigm in the context of object-oriented design methodology. Similar ideas are being explored in other areas of compu...
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vi...