3 search results - page 1 / 1 » Use ECP, not ECC, for hard failures in resistive memories |
155
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ISCA
2010
IEEE
15 years 10 months ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
189
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EMSOFT
2009
Springer
16 years 17 days ago
2009
Springer
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...
188
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CODES
2009
IEEE
16 years 23 days ago
2009
IEEE
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage med...