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DAC
2008
ACM
16 years 7 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
2000
ACM
16 years 7 months ago
On switch factor based analysis of coupled RC interconnects
We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...
Andrew B. Kahng, Sudhakar Muddu, Egino Sarto
ICML
2004
IEEE
16 years 7 months ago
Learning associative Markov networks
Markov networks are extensively used to model complex sequential, spatial, and relational interactions in fields as diverse as image processing, natural language analysis, and bio...
Benjamin Taskar, Vassil Chatalbashev, Daphne Kolle...
ECOOP
2009
Springer
16 years 7 months ago
Fine-Grained Access Control with Object-Sensitive Roles
Role-based access control (RBAC) is a common paradigm to ensure that users have sufficient rights to perform various system operations. In many cases though, traditional RBAC does ...
Jeffrey Fischer, Daniel Marino, Rupak Majumdar, To...
CHI
2008
ACM
16 years 7 months ago
You've been warned: an empirical study of the effectiveness of web browser phishing warnings
Many popular web browsers now include active phishing warnings since research has shown that passive warnings are often ignored. In this laboratory study we examine the effectiven...
Serge Egelman, Lorrie Faith Cranor, Jason I. Hong