872 search results - page 29 / 175 » UML-based design test generation |
176
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ISOLA
2010
Springer
15 years 4 months ago
2010
Springer
Abstract. This article deals with performance verifications of architecture models of real-time embedded systems. We focus on models verified with the real-time scheduling theory...
159
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DSD
2010
IEEE
15 years 4 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
128
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ITC
1989
IEEE
15 years 10 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
140
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DAC
1997
ACM
15 years 10 months ago
1997
ACM
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
151
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ATS
2005
IEEE
15 years 11 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...