5433 search results - page 809 / 1087 » Tool Support for Traceability-Adaptation |
169
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DDECS
2007
IEEE
16 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
175
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ECBS
2007
IEEE
16 years 1 months ago
2007
IEEE
Design patterns document expert design experience in software system development. They have been applied in many existing software systems. However, pattern information is general...
176
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EDOC
2007
IEEE
16 years 1 months ago
2007
IEEE
Models have been used in various engineering fields to help managing complexity and represent information in difbstraction levels, according to specific notations and stakeholde...
149
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ESCIENCE
2007
IEEE
16 years 1 months ago
2007
IEEE
The electronics design industry is facing major challenges as transistors continue to decrease in size. The next generation of devices will be so small that the position of indivi...
186
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FBIT
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper explores refinements to methods used in a procedure being developed by the authors to personalize user interfaces for online shopping support tools. In the authors’ ...