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» Timed circuits: a new paradigm for high-speed design
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GLVLSI
2000
IEEE
145views VLSI» more  GLVLSI 2000»
15 years 10 months ago
Manhattan or non-Manhattan?: a study of alternative VLSI routing architectures
Circuit interconnect has become a substantial obstacle in the design of high performance systems. In this paper we explore a new routing paradigm that strikes at the root of the i...
Cheng-Kok Koh, Patrick H. Madden
ISLPED
2005
ACM
68views Hardware» more  ISLPED 2005»
15 years 11 months ago
Two efficient methods to reduce power and testing time
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
Il-soo Lee, Tony Ambler
ICCAD
2001
IEEE
108views Hardware» more  ICCAD 2001»
16 years 3 months ago
Placement Driven Retiming with a Coupled Edge Timing Model
Retiming is a widely investigated technique for performance optimization. It performs powerful modifications on a circuit netlist. However, often it is not clear, whether the pred...
Ingmar Neumann, Wolfgang Kunz
ETS
2011
IEEE
220views Hardware» more  ETS 2011»
14 years 5 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...
DATE
2002
IEEE
135views Hardware» more  DATE 2002»
15 years 11 months ago
Reducing Test Application Time Through Test Data Mutation Encoding
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
Sherief Reda, Alex Orailoglu