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TCAD
2008
119views more  TCAD 2008»
15 years 6 months ago
Full-Chip Routing Considering Double-Via Insertion
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures due to the copper cladding process. To improve via yield and reliability, ...
Huang-Yu Chen, Mei-Fang Chiang, Yao-Wen Chang, Lum...
TCAD
2008
88views more  TCAD 2008»
15 years 6 months ago
Self-Adaptive Data Caches for Soft-Error Reliability
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
AR
2005
115views more  AR 2005»
15 years 6 months ago
Insights toward robot-assisted evacuation
This paper discusses the application of robotic technologies to an evacuation assistance task. We describe how this kind of task differs from the more prevalent search and rescue ...
Dylan A. Shell, Maja J. Mataric
IS
2007
15 years 6 months ago
Matching large schemas: Approaches and evaluation
Current schema matching approaches still have to improve for large and complex Schemas. The large search space increases the likelihood for false matches as well as execution time...
Hong Hai Do, Erhard Rahm
IS
2007
15 years 6 months ago
Browsing large online data tables using generalized query previews
Companies, government agencies, and other organizations are making their data available to the world over the Internet. They often use large online relational tables for this purp...
Egemen Tanin, Ben Shneiderman, Hairuo Xie
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