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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 10 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
CVPR
2004
IEEE
15 years 10 months ago
Midstream Content Access of Visual Pattern Coded Imagery
Multimedia retrieval is going to play an increasingly important role in the future. Since the availability of digital media seems ever rising, not only the retrieval performance i...
Gerald Schaefer
CPM
1995
Springer
139views Combinatorics» more  CPM 1995»
15 years 10 months ago
Pattern-Matching for Strings with Short Descriptions
We consider strings which are succinctly described. The description is in terms of straight-line programs in which the constants are symbols and the only operation is the concaten...
Marek Karpinski, Wojciech Rytter, Ayumi Shinohara
SERP
2007
15 years 8 months ago
From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
Justyna Zander-Nowicka, Abel Marrero Pérez,...
AAAI
2006
15 years 8 months ago
Monitoring Food Safety by Detecting Patterns in Consumer Complaints
EPFC (Emerging Patterns in Food Complaints) is the analytical component of the Consumer Complaint Monitoring System, designed to help the food safety officials to efficiently and ...
Artur Dubrawski, Kimberly Elenberg, Andrew W. Moor...