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177
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
158
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ICMCS
2008
IEEE
16 years 1 months ago
2008
IEEE
The support of variable block-sizes, though significantly improves the compression efficiency, imposes a big computational challenge on an H.264 encoder. In this paper, we present...
172
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
160
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SEKE
2007
Springer
16 years 23 days ago
2007
Springer
This paper presents a strategy, based on requirement patterns (RP), aimed at improving the requirement analysis discipline by allowing business analysts (BA) to produce more relia...
167
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ICRA
2005
IEEE
16 years 7 days ago
2005
IEEE
— This paper describes a generation method for spatially natural biped walking. By limiting the COG (Center of Gravity) motion space to a sculptured surface, the degree of freedo...