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VLSID
2002
IEEE
115views VLSI» more  VLSID 2002»
16 years 7 months ago
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Scan Circuits
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Irith Pomeranz, Sudhakar M. Reddy
ICANN
1997
Springer
15 years 10 months ago
Spatio-Temporal Pattern Recognition with Neural Networks: Application to Speech
The processing or the recognition of non stationary process with neural networks is a challenging and yet unsolved issue. The paper discuss the general pattern recognition framewor...
Jean Rouat
JCP
2006
139views more  JCP 2006»
15 years 6 months ago
Generalized Sequential Pattern Mining with Item Intervals
Sequential pattern mining is an important data mining method with broad applications that can extract frequent sequences while maintaining their order. However, it is important to ...
Yu Hirate, Hayato Yamana
CHI
2008
ACM
16 years 7 months ago
Query suggestions for mobile search: understanding usage patterns
Entering search terms on mobile phones is a time consuming and cumbersome task. In this paper, we explore the usage patterns of query entry interfaces that display suggestions. Ou...
Maryam Kamvar, Shumeet Baluja
HPCA
2008
IEEE
16 years 1 months ago
Prediction of CPU idle-busy activity pattern
Real-world workloads rarely saturate multi-core processor. CPU C-states can be used to reduce power consumption during processor idle time. The key unsolved problem is: when and h...
Qian Diao, Justin J. Song