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ICCAD
2008
IEEE
98views Hardware» more  ICCAD 2008»
16 years 3 months ago
Statistical path selection for at-speed test
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...
ICASSP
2009
IEEE
16 years 1 months ago
Modeling and tracking of faces in real-life illumination conditions
In this paper, we address the problem of face tracking across illumination changes and occlusions. The method is based on leveraging the strengths of both Adaboost to deal with cl...
Rahul Thota, Archana Kalyansundar, Amit Kale
KBSE
2009
IEEE
16 years 1 months ago
ReAssert: Suggesting Repairs for Broken Unit Tests
—Developers often change software in ways that cause tests to fail. When this occurs, developers must determine whether failures are caused by errors in the code under test or in...
Brett Daniel, Vilas Jagannath, Danny Dig, Darko Ma...
P2P
2009
IEEE
167views Communications» more  P2P 2009»
16 years 1 months ago
ID Repetition in Kad
ID uniqueness is essential in DHT-based systems as peer lookup and resource searching rely on IDmatching. Many previous works and measurements on Kad do not take into account that...
Jie Yu, Chengfang Fang, Jia Xu, Ee-Chien Chang, Zh...
FCCM
2008
IEEE
205views VLSI» more  FCCM 2008»
16 years 1 months ago
Credit Risk Modelling using Hardware Accelerated Monte-Carlo Simulation
The recent turmoil in global credit markets has demonstrated the need for advanced modelling of credit risk, which can take into account the effects of changing economic condition...
David B. Thomas, Wayne Luk