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VTS
2007
IEEE
129views Hardware» more  VTS 2007»
16 years 28 days ago
Supply Voltage Noise Aware ATPG for Transition Delay Faults
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
ISCAS
2007
IEEE
113views Hardware» more  ISCAS 2007»
16 years 27 days ago
A Low Power 4-bit Interleaved Burst Sampling ADC for Sub-GHz Impulse UWB Radio
Abstract—This paper presents a low power 4-bit ADC for subGHz Ultra Wideband (UWB) receivers. The power efficiency is achieved by taking advantage of the low duty cycle feature o...
Xiaodong Zhang, Magdy Bayoumi
FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
16 years 25 days ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung
SEKE
2007
Springer
16 years 24 days ago
TRAP.NET: A Realization of Transparent Shaping in .NET
We define adaptability as the capacity of software in adjusting its behavior in response to changing conditions. To list just a few examples, adaptability is important in pervasiv...
Seyed Masoud Sadjadi, Fernando Trigoso
197
Voted
CODES
2006
IEEE
16 years 22 days ago
Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...