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ISARCS
2010
156views Hardware» more  ISARCS 2010»
15 years 8 months ago
A Road to a Formally Verified General-Purpose Operating System
Methods of formal description and verification represent a viable way for achieving fundamentally bug-free software. However, in reality only a small subset of the existing operati...
Martin Decký
AICCSA
2008
IEEE
209views Hardware» more  AICCSA 2008»
15 years 8 months ago
Transistor-level based defect tolerance for reliable nanoelectronics
Nanodevices based circuit design will be based on the acceptance that a high percentage of devices in the design will be defective. In this work, we investigate a defect tolerant ...
Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Mel...
ASAP
2007
IEEE
109views Hardware» more  ASAP 2007»
15 years 8 months ago
Long Live Small Fan-in Majority Gates Their Reign Looks Like Coming!
This paper explores the reliability of three different minimum fan-in majority gates full adder (FA) designs, and compares them to the performance of a standard XOR-based FA. The ...
Walid Ibrahim, Valeriu Beiu
ASAP
2007
IEEE
134views Hardware» more  ASAP 2007»
15 years 8 months ago
Methodology and Toolset for ASIP Design and Development Targeting Cryptography-Based Applications
Network processors utilizing general-purpose instruction-set architectures (ISA) limit network throughput due to latency incurred from cryptography and hashing applications (AES, ...
David Montgomery, Ali Akoglu
ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
15 years 8 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura