Methods of formal description and verification represent a viable way for achieving fundamentally bug-free software. However, in reality only a small subset of the existing operati...
Nanodevices based circuit design will be based on the acceptance that a high percentage of devices in the design will be defective. In this work, we investigate a defect tolerant ...
Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Mel...
This paper explores the reliability of three different minimum fan-in majority gates full adder (FA) designs, and compares them to the performance of a standard XOR-based FA. The ...
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...