6111 search results - page 848 / 1223 » Time, Hardware, and Uniformity |
154
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MSS
2000
IEEE
15 years 11 months ago
2000
IEEE
We describe a real implementation of a software component that manages caching of files from a tertiary storage management system to a large disk cache developed for use in the a...
240
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
169
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
A novel design-for-test (DFT) technique is presented for designing a core with a “virtual scan chain” which looks (to the system integrator) like it is shorter than the real s...
200
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
193
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...