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172
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ISQED
2003
IEEE
16 years 6 days ago
2003
IEEE
This paper describes the use of integer equations for high level modeling digital circuits for application of formal verification properties at this level. Most formal verificatio...
203
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ISQED
2003
IEEE
16 years 6 days ago
2003
IEEE
The nature of IC design has is necessarily evolving to a more data-centric design flow in which EDA tools share a common information in a design database without the negative cost...
165
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ITC
2003
IEEE
16 years 6 days ago
2003
IEEE
Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
143
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ITC
2003
IEEE
16 years 6 days ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
169
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ITC
2003
IEEE
16 years 6 days ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...