6111 search results - page 833 / 1223 » Time, Hardware, and Uniformity |
186
click to vote
DATE
2003
IEEE
16 years 7 days ago
2003
IEEE
The design of clock distribution networks in synchronous digital systems presents enormous challenges. Controlling the clock signal delay in the presence of various noise sources,...
177
click to vote
DATE
2003
IEEE
16 years 7 days ago
2003
IEEE
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
195
click to vote
ICCAD
2003
IEEE
16 years 7 days ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
181
click to vote
ICDCS
2003
IEEE
16 years 7 days ago
2003
IEEE
A range of database services are being offered on clusters of workstations today to meet the demanding needs of applications with voluminous datasets, high computational and I/O r...
171
click to vote
IEEEPACT
2003
IEEE
16 years 6 days ago
2003
IEEE
Modern architecture research relies heavily on detailed pipeline simulation. Simulating the full execution of an industry standard benchmark can take weeks to months to complete. ...