6111 search results - page 816 / 1223 » Time, Hardware, and Uniformity |
148
click to vote
ISQED
2007
IEEE
16 years 1 months ago
2007
IEEE
For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
197
click to vote
MICRO
2007
IEEE
16 years 1 months ago
2007
IEEE
Modern chip multiprocessors (CMPs) are designed to exploit both instruction-level parallelism (ILP) within processors and thread-level parallelism (TLP) within and across processo...
151
click to vote
MICRO
2007
IEEE
16 years 1 months ago
2007
IEEE
Parameter variation is detrimental to a processor’s frequency and leakage power. One proposed technique to mitigate it is Fine-Grain Body Biasing (FGBB), where different parts o...
163
click to vote
MTV
2007
IEEE
16 years 1 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
201
click to vote
SBACPAD
2007
IEEE
16 years 1 months ago
2007
IEEE
Multi-dimensional imaging techniques involve the processing of high resolution images commonly used in medical, civil and remote-sensing applications. A barrier commonly encounter...