6111 search results - page 808 / 1223 » Time, Hardware, and Uniformity |
120
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
177
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
The NETWORK-ON-CHIP (NOC) interconnection paradigm has been gaining momentum thanks to its flexibility, scalability and suitability to deep submicron technology processes. The ne...
177
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
The wiring effort and thus, the routability of electronic designs such as printed circuit boards, multi chip modules and single chip modules largely depends on the assignment of s...
177
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
179
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
—The contribution of memory latency to execution time continues to increase, and latency hiding mechanisms become ever more important for efficient processor design. While high-...