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ICCAD
2006
IEEE
134views Hardware» more  ICCAD 2006»
16 years 3 months ago
A delay fault model for at-speed fault simulation and test generation
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
Irith Pomeranz, Sudhakar M. Reddy
ICCAD
2006
IEEE
71views Hardware» more  ICCAD 2006»
16 years 3 months ago
Using CAD to shape experiments in molecular QCA
This paper examines how circuits and systems made from molecular QCA devices might function. Our design constraints are “chemically reasonable” in that we consider the charact...
Michael T. Niemier, Michael Crocker, Xiaobo Sharon...
ICCAD
2006
IEEE
177views Hardware» more  ICCAD 2006»
16 years 3 months ago
Fast and accurate transaction level models using result oriented modeling
Efficient communication modeling is a critical task in SoC design and exploration. In particular, fast and accurate communication is needed to predict the performance of a system....
Gunar Schirner, Rainer Dömer
ICCAD
2006
IEEE
116views Hardware» more  ICCAD 2006»
16 years 3 months ago
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
Erkan Acar, Sule Ozev, Kevin B. Redmond
ICCAD
2006
IEEE
119views Hardware» more  ICCAD 2006»
16 years 3 months ago
Energy management for real-time embedded systems with reliability requirements
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
Dakai Zhu, Hakan Aydin