6111 search results - page 700 / 1223 » Time, Hardware, and Uniformity |
164
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ISCAS
2008
IEEE
16 years 1 months ago
2008
IEEE
— In this paper, a new hybrid photodiode-photogate (HPDPG) CMOS APS pixel for high-dynamic range imaging applications is presented. The HPDPG pixel composes of a biased photogate...
181
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ISCAS
2008
IEEE
16 years 1 months ago
2008
IEEE
—In this paper, an energy-efficient and high performance ternary content addressable memory (TCAM) are presented. It employs the concept of “green” microarchitecture and circ...
198
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ISQED
2008
IEEE
16 years 1 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
166
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MICRO
2008
IEEE
16 years 1 months ago
2008
IEEE
Processors progressively age during their service life due to normal workload activity. Such aging results in gradually slower circuits. Anticipating this fact, designers add timi...
204
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ACSD
2007
IEEE
16 years 1 months ago
2007
IEEE
We study sensor minimization problems in the context of fault diagnosis. Fault diagnosis consists in synthesizing a diagnoser that observes a given plant and identifies faults in...