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DATE
2009
IEEE
134views Hardware» more  DATE 2009»
16 years 2 months ago
A diagnosis algorithm for extreme space compaction
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
Stefan Holst, Hans-Joachim Wunderlich
ICECCS
2009
IEEE
119views Hardware» more  ICECCS 2009»
16 years 1 months ago
REMES: A Resource Model for Embedded Systems
In this paper, we introduce the model REMES for formal modeling and analysis of embedded resources such as storage, energy, communication, and computation. The model is a state-ma...
Cristina Cerschi Seceleanu, Aneta Vulgarakis, Paul...
IEEEPACT
2009
IEEE
16 years 1 months ago
Automatic Tuning of Discrete Fourier Transforms Driven by Analytical Modeling
—Analytical models have been used to estimate optimal values for parameters such as tile sizes in the context of loop nests. However, important algorithms such as fast Fourier tr...
Basilio B. Fraguela, Yevgen Voronenko, Markus P&uu...
ECMDAFA
2009
Springer
170views Hardware» more  ECMDAFA 2009»
16 years 1 months ago
A Model Driven Approach to the Analysis of Timeliness Properties
The need for a design language that is rigorous but accessible and intuitive is often at odds with the formal and mathematical nature of languages used for analysis. UML and Petri ...
Mohamed Ariff Ameedeen, Behzad Bordbar, Rachid Ana...
SAT
2009
Springer
126views Hardware» more  SAT 2009»
16 years 1 months ago
Extending SAT Solvers to Cryptographic Problems
Cryptography ensures the confidentiality and authenticity of information but often relies on unproven assumptions. SAT solvers are a powerful tool to test the hardness of certain ...
Mate Soos, Karsten Nohl, Claude Castelluccia