6111 search results - page 620 / 1223 » Time, Hardware, and Uniformity |
178
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ITC
2003
IEEE
16 years 22 days ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
200
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ITC
2003
IEEE
16 years 22 days ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
208
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ITC
2003
IEEE
16 years 22 days ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
186
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SBACPAD
2003
IEEE
16 years 21 days ago
2003
IEEE
Trace reuse improves the performance of processors by skipping the execution of sequences of redundant instructions. However, many reusable traces do not have all of their inputs ...
197
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FPL
2003
Springer
16 years 20 days ago
2003
Springer
The use of FPGAs for cryptographic applications is highly attractive for a variety of reasons but at the same time there are many open issues related to the general security of FPG...