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199
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DATE
2005
IEEE
16 years 1 months ago
2005
IEEE
The objective of this paper is to introduce dependability as an optimization criterion in the system-level design process of embedded systems. Given the pervasiveness of embedded ...
197
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DATE
2005
IEEE
16 years 1 months ago
2005
IEEE
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...
172
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DATE
2005
IEEE
16 years 1 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
202
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DSD
2005
IEEE
16 years 1 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
228
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ECBS
2005
IEEE
16 years 1 months ago
2005
IEEE
This paper describes SOPA, a component framework that is an essential part of the lecture recording system E-Chalk. It envisages a general processing and streaming architecture fe...