6111 search results - page 609 / 1223 » Time, Hardware, and Uniformity |
198
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
172
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Systems integration is a major challenge in many industries. Systematic analysis of the complex integration effects, especially with respect to timing and performance, significant...
206
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
The ever increasing complexity and heterogeneity of modern System-on-Chip (SoC) architectures make an early and systematic exploration of alternative solutions mandatory. Efficien...
168
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DDECS
2006
IEEE
16 years 1 months ago
2006
IEEE
—Parallel memory modules can be used to increase memory bandwidth and feed a processor with only necessary data. Arbitrary stride access capability with interleaved memories is d...
216
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DDECS
2006
IEEE
16 years 1 months ago
2006
IEEE
Abstract: Bisimulations in general are a powerful concept to minimize large finite state systems regarding some well-defined observational behavior. In contrast to strong bisimul...