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Time, Hardware, and Uniformity
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ICCAD
2005
IEEE
76
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A unified framework for statistical timing analysis with coupling and multiple input switching
15 years 11 months ago
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www.eecs.northwestern.edu
Debjit Sinha, Hai Zhou
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121
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ITC
2003
IEEE
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ITC 2003
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Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing
15 years 11 months ago
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poisson.usc.edu
Kun Young Chung, Sandeep K. Gupta
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141
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ITC
2003
IEEE
93
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ITC 2003
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On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs
15 years 11 months ago
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www.itcprogramdev.org
Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
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132
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DATE
2002
IEEE
74
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DATE 2002
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Extending Synchronous Languages for Generating Abstract Real-Time Models
15 years 11 months ago
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www.cs.york.ac.uk
George Logothetis, Klaus Schneider
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128
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ISCAS
2002
IEEE
85
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ISCAS 2002
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Automated test development and test time reduction for RF subsystems
15 years 11 months ago
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cseweb.ucsd.edu
Sule Ozev, Alex Orailoglu, Hosam Haggag
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