6111 search results - page 1071 / 1223 » Time, Hardware, and Uniformity |
168
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VTS
2008
IEEE
16 years 26 days ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
194
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VTS
2008
IEEE
16 years 26 days ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
140
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ARITH
2007
IEEE
16 years 25 days ago
2007
IEEE
The floating point unit of the next generation PowerPC is detailed. It has been tested at over 5 GHz. The design supports an extremely aggressive cycle time of 13 FO4 using a tech...
157
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ASAP
2007
IEEE
16 years 25 days ago
2007
IEEE
With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip and multicore architect...
179
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CODES
2007
IEEE
16 years 25 days ago
2007
IEEE
We propose a method for dynamic security domain scaling on SMPs that offers both highly scalable performance and high security for future high-end embedded systems. Its most impor...