3356 search results - page 421 / 672 » Thresholds and Expectation Thresholds |
179
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CHI
2007
ACM
16 years 7 months ago
2007
ACM
It is difficult to design and test location-enhanced applications. A large part of this difficulty is due to the added complexity of supporting location. Wizard of Oz (WOz) has be...
150
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
181
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
We present minimization methodologies and an algorithm for simultaneous scheduling, binding, and allocation for the reduction of total power and power fluctuation during behaviora...
168
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
190
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...