1476 search results - page 206 / 296 » Three-dimensional integrated circuits |
164
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ICCAD
2009
IEEE
15 years 3 months ago
2009
IEEE
In this paper, an adaptive sampling method is proposed for the statistical SRAM cell analysis. The method is composed of two components. One part is the adaptive sampler that manip...
161
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ICCAD
2009
IEEE
15 years 3 months ago
2009
IEEE
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...
119
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ICCAD
2009
IEEE
15 years 3 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
169
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TE
2010
15 years 26 days ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
206
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FPL
2011
Springer
14 years 5 months ago
2011
Springer
Abstract—Soft on-FGPA interconnection networks are gaining increasing importance since they simplify the integration of heterogeneous components and offer, at the same time, a mo...