4233 search results - page 388 / 847 » Three Paths to Effectiveness |
158
click to vote
ICCD
2007
IEEE
16 years 3 months ago
2007
IEEE
Parameter variations are a major factor causing powerperformance asymmetry in chip multiprocessors. In this paper, we analyze the effects of with-in-die (WID) process variations o...
177
click to vote
ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
175
click to vote
ICCD
2001
IEEE
16 years 3 months ago
2001
IEEE
As the operating frequency increases to Giga Hertz and the rise time of a signal is less than or comparable to the time-of-flight delay of a line, it is necessary to consider the...
191
click to vote
ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
145
click to vote
ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...