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ICCAD
2004
IEEE
88views Hardware» more  ICCAD 2004»
16 years 3 months ago
Interconnect lifetime prediction under dynamic stress for reliability-aware design
Thermal effects are becoming a limiting factor in highperformance circuit design due to the strong temperaturedependence of leakage power, circuit performance, IC package cost and...
Zhijian Lu, Wei Huang, John Lach, Mircea R. Stan, ...
FDL
2006
IEEE
16 years 13 days ago
Functional Virtual Prototyping Design Flow and VHDL-AMS
Needs in the worldwide competition push teams to master more and more their design flow in order to minimize risks, costs, time to market, and potential liabilities. The classical...
Yannick Hervé, Patricia Desgreys
DAC
2011
ACM
14 years 6 months ago
Non-uniform micro-channel design for stacked 3D-ICs
Micro-channel cooling shows great potential in removing high density heat in 3D circuits. The current micro-channel heat sink designs spread the entire surface to be cooled with m...
Bing Shi, Ankur Srivastava, Peng Wang
ICCD
2007
IEEE
225views Hardware» more  ICCD 2007»
16 years 3 months ago
Fine grain 3D integration for microarchitecture design through cube packing exploration
Most previous 3D IC research focused on “stacking” traditional 2D silicon layers, so the interconnect reduction is limited to interblock delays. In this paper, we propose tech...
Yongxiang Liu, Yuchun Ma, Eren Kursun, Glenn Reinm...
ASPDAC
2012
ACM
238views Hardware» more  ASPDAC 2012»
14 years 2 months ago
Design for manufacturability and reliability for TSV-based 3D ICs
—The 3D IC integration using through-silicon-vias (TSV) has gained tremendous momentum recently for industry adoption. However, as TSV involves disruptive manufacturing technolog...
David Z. Pan, Sung Kyu Lim, Krit Athikulwongse, Mo...