Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
The similarity search has become a fundamental computational task in many applications. One of the mathematical models of the similarity – the metric space – has drawn attenti...
Molecular Dynamics simulations have become an interesting target for acceleration using Field-Programmable Gate Arrays (FPGA). Still to be attempted completely in FPGA hardware is...
Large shipyards for gigantic cruise ships require a special attention to safety due to the huge number of workers involved and to the complex structure of spaces. A critical issue...
Augusto Celentano, Fabio Furlan, Stefano Burcovich
Field studies show that in many learning settings paper has intrinsic advantages over electronic documents. In this paper we present concepts for the collaborative annotation and ...