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Publication
In recent years, with camera pixels shrinking in size, images are more likely to include defocused regions. In order to recover scene details from defocused regions, deblurring tec...
147
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
As technology scales, interconnects dominate the performance and power behavior of deep submicron designs. Three-dimensional integrated circuits (3D ICs) have been proposed as a w...
173
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
— Since rapid progress has been made in device improvement and integration of small carbon nanotube fieldeffect transistors (CNFETs) circuits, the time has come for developing c...
161
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
150
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....