2916 search results - page 264 / 584 » The simulation power of automod |
172
click to vote
VTS
2008
IEEE
16 years 29 days ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
173
click to vote
GLOBECOM
2007
IEEE
16 years 28 days ago
2007
IEEE
— In this paper, we study a wireless multiple-input multiple-output system in a Rayleigh flat-fading environment with correlation among the transmit antennas. We assume that the...
157
click to vote
GLOBECOM
2007
IEEE
16 years 28 days ago
2007
IEEE
—The trellis shaping (TS) is an effective technique not only for average power reduction of high-order QAM signals, but also for peak power reduction of band-limited single-carri...
172
click to vote
ISCAS
2006
IEEE
16 years 19 days ago
2006
IEEE
—Linear amplification with nonlinear components (LINC) technique is a linearization technique for power amplifier designs. By using LINC, the nonlinear power amplifier with high ...
142
click to vote
ICMENS
2005
IEEE
16 years 6 days ago
2005
IEEE
The influence of thermal effects on the reliability of RF MEMS switches is investigated in this paper. Low power consumption and capacity to handle high power at very high frequen...