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DATE
2008
IEEE
86views Hardware» more  DATE 2008»
16 years 1 months ago
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Ric...
DATE
2007
IEEE
164views Hardware» more  DATE 2007»
16 years 26 days ago
Distributed power-management techniques for wireless network video systems
Wireless sensor networks operating on limited energy resources need to be power efficient to extend the system lifetime. This is especially challenging for video sensor networks d...
Nicholas H. Zamora, Jung-Chun Kao, Radu Marculescu
ICC
2007
IEEE
16 years 25 days ago
UWB Geo-Regioning Using Multivariate Channel Statistics
Abstract— Ultra-Wideband (UWB) Geo-Regioning is an approach to localize UWB transmitters by means of their channel impulse responses. A received channel impulse response is assig...
Christoph Steiner, Armin Wittneben
VTC
2007
IEEE
107views Communications» more  VTC 2007»
16 years 24 days ago
Random Switched Beamforming for Uplink Wireless Sensor Networks
– Integration of beamforming to sensors is very beneficial for a reduction of transmission power consumption and for improvement of the overall system performance. Unfortunately,...
Mohammed Elmusrati, Vesa Hasu
AUTOID
2005
IEEE
16 years 4 days ago
Impedance Matching Concepts in RFID Transponder Design
In this paper, we analyze impedance matching concepts in passive radio frequency identification (RFID) transponders, which are powered by the incoming RF energy and consist of an...
K. V. S. Rao, Pavel V. Nikitin, Sander F. Lam