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ADBIS
2006
Springer
166views Database» more  ADBIS 2006»
16 years 23 days ago
Clustering-Based Materialized View Selection in Data Warehouses
materialized view selection is a non-trivial task. Hence, its complexity must be reduced. A judicious choice of views must be costdriven and influenced by the workload experienced...
Kamel Aouiche, Pierre-Emmanuel Jouve, Jér&o...
ADBIS
2006
Springer
104views Database» more  ADBIS 2006»
16 years 23 days ago
Multi-source Materialized Views Maintenance: Multi-level Views
In many information systems, the databases that make up the system are distributed in different modules or branch offices according to the requirements of the business enterprise. ...
Josep Silva, Jorge Belenguer, Matilde Celma
ACL2
2006
ACM
16 years 23 days ago
Phylogenetic trees in ACL2
Biologists studying the evolutionary relationships between organisms use software packages to solve the computational problems they encounter. Several of these problems involve th...
Warren A. Hunt Jr., Serita M. Nelesen
ASPDAC
2006
ACM
104views Hardware» more  ASPDAC 2006»
16 years 23 days ago
A multi-technology-process reticle floorplanner and wafer dicing planner for multi-project wafers
—As the VLSI manufacturing technology advances into the deep sub-micron(DSM) era, the mask cost can reach one or two million dollars. Multiple project wafers (MPW) which put diï¬...
Chien-Chang Chen, Wai-Kei Mak
ASPDAC
2006
ACM
144views Hardware» more  ASPDAC 2006»
16 years 23 days ago
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...