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ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
15 years 12 months ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
KBSE
2003
IEEE
15 years 12 months ago
Automated Software Testing Using a Metaheuristic Technique Based on Tabu Search
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...
Eugenia Díaz, Javier Tuya, Raquel Blanco
DAC
2003
ACM
15 years 12 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
SBCCI
2003
ACM
94views VLSI» more  SBCCI 2003»
15 years 12 months ago
A New Pipelined Array Architecture for Signed Multiplication
– We present a new architecture for signed multiplication which maintains the pure form of an array multiplier, exhibiting a much lower overhead than the Booth architecture. This...
Eduardo A. C. da Costa, Sergio Bampi, José ...
CAISE
2003
Springer
15 years 12 months ago
Selection of Web Services for Composition Using Location of Provider Hosts Criterion
We present a Web service composition approach that relies on three selection criteria: execution cost, execution time, and location of provider hosts. A Web service is an accessibl...
Zakaria Maamar, Quan Z. Sheng, Boualem Benatallah