Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
This paper presents a new formalism and a new algorithm for verifying timed circuits. The formalism, called orbital nets, allows hierarchical verification based on abehavioralseman...
Theorem provers based on model elimination have exhibited extremely high inference rates but have lacked a redundancy control mechanism such as subsumption. In this paper we repor...
Abstract. We reduce ranking, as measured by the Area Under the Receiver Operating Characteristic Curve (AUC), to binary classification. The core theorem shows that a binary classif...
In this paper we present a policy-based admission control architecture responsible for managing the installation and aggregation of packet-based LSPs within lightpaths (optical LS...