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ITC
1993
IEEE
104views Hardware» more  ITC 1993»
15 years 10 months ago
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
M. F. Toner, Gordon W. Roberts
CAV
1994
Springer
111views Hardware» more  CAV 1994»
15 years 10 months ago
Automatic Verification of Timed Circuits
This paper presents a new formalism and a new algorithm for verifying timed circuits. The formalism, called orbital nets, allows hierarchical verification based on abehavioralseman...
Tomas Rokicki, Chris J. Myers
CADE
1992
Springer
15 years 10 months ago
Caching and Lemmaizing in Model Elimination Theorem Provers
Theorem provers based on model elimination have exhibited extremely high inference rates but have lacked a redundancy control mechanism such as subsumption. In this paper we repor...
Owen L. Astrachan, Mark E. Stickel
COLT
2007
Springer
15 years 10 months ago
Robust Reductions from Ranking to Classification
Abstract. We reduce ranking, as measured by the Area Under the Receiver Operating Characteristic Curve (AUC), to binary classification. The core theorem shows that a binary classif...
Maria-Florina Balcan, Nikhil Bansal, Alina Beygelz...
BROADNETS
2004
IEEE
15 years 10 months ago
Policy-Based Admission Control in GMPLS Optical Networks
In this paper we present a policy-based admission control architecture responsible for managing the installation and aggregation of packet-based LSPs within lightpaths (optical LS...
Fábio Luciano Verdi, Maurício F. Mag...