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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
16 years 6 months ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
EDOC
2007
IEEE
16 years 19 days ago
Implementing Business Conversations with Consistency Guarantees Using Message-Oriented Middleware
The paper considers distributed applications where interactions between constituent services take place via messages in an asynchronous environment with unpredictable communicatio...
Carlos Molina-Jiménez, Santosh K. Shrivasta...
GLOBECOM
2006
IEEE
16 years 10 days ago
Toward Understanding the Behavior of BGP During Large-Scale Power Outages
— While the Internet continues to thrive, the resiliency of its fundamental routing infrastructure is not fully understood. In this paper, we analyze the behavior of the de facto...
Jun Li, Zhen Wu, Eric Purpus
DIS
2008
Springer
15 years 8 months ago
Feature Selection in Taxonomies with Applications to Paleontology
Taxonomies for a set of features occur in many real-world domains. An example is provided by paleontology, where the task is to determine the age of a fossil site on the basis of t...
Gemma C. Garriga, Antti Ukkonen, Heikki Mannila
ICPR
2010
IEEE
15 years 4 months ago
Exploiting Combined Multi-level Model for Document Sentiment Analysis
This paper focuses on the task of text sentiment analysis in hybrid online articles and web pages. Traditional approaches of text sentiment analysis typically work at a particular ...
Si Li, Hao Zhang, Weiran Xu, Guang Chen, Jun Guo