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EVOW
2008
Springer
15 years 8 months ago
Evolving an Automatic Defect Classification Tool
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Assaf Glazer, Moshe Sipper
PRIS
2007
15 years 7 months ago
Automatic Face Alignment by Maximizing Similarity Score
Accurate face registration is of vital importance to the performance of a face recognition algorithm. We propose a face registration method which searches for the optimal alignment...
Bas Boom, Luuk J. Spreeuwers, Raymond N. J. Veldhu...
ECIR
2006
Springer
15 years 7 months ago
Towards Automatic Retrieval of Album Covers
We present first steps towards intelligent retrieval of music album covers from the web. The continuous growth of electronic music distribution constantly increases the interest in...
Markus Schedl, Peter Knees, Tim Pohle, Gerhard Wid...
DICTA
2003
15 years 7 months ago
A Robust Method for Estimating the Fundamental Matrix
In this paper, we propose a robust method to estimate the fundamental matrix in the presence of outliers. The new method uses random minimum subsets as a search engine to find inli...
C. L. Feng, Y. S. Hung
NIPS
2004
15 years 7 months ago
Euclidean Embedding of Co-Occurrence Data
Embedding algorithms search for low dimensional structure in complex data, but most algorithms only handle objects of a single type for which pairwise distances are specified. Thi...
Amir Globerson, Gal Chechik, Fernando C. Pereira, ...