Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Accurate face registration is of vital importance to the performance of a face recognition algorithm. We propose a face registration method which searches for the optimal alignment...
Bas Boom, Luuk J. Spreeuwers, Raymond N. J. Veldhu...
We present first steps towards intelligent retrieval of music album covers from the web. The continuous growth of electronic music distribution constantly increases the interest in...
Markus Schedl, Peter Knees, Tim Pohle, Gerhard Wid...
In this paper, we propose a robust method to estimate the fundamental matrix in the presence of outliers. The new method uses random minimum subsets as a search engine to find inli...
Embedding algorithms search for low dimensional structure in complex data, but most algorithms only handle objects of a single type for which pairwise distances are specified. Thi...
Amir Globerson, Gal Chechik, Fernando C. Pereira, ...