—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
In this paper, we present a reduced order inodeling methodology, based on the utilization of optimal non-uniform grids generated by Gaussian spectral rules, for the direct passive...
Traianos Yioultsis, Anne Woo, Andreas C. Cangellar...
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
A mixed potential integral equation (MPIE) technique combined with fast multi-layer Green’s functions and Gaussian Jacobi high order techniques is used to compute the 3-D freque...
We present a generic objectness measure, quantifying how
likely it is for an image window to contain an object of
any class. We explicitly train it to distinguish objects with
a...
Pierre America, Robin Milner, Oscar Nierstrasz, Ma...