1732 search results - page 72 / 347 » The design of a reliable reputation system |
166
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ISCAS
2007
IEEE
16 years 17 days ago
2007
IEEE
Abstract—In the nanometer-scale CMOS technology, the gateoxide thickness has been scaled down to support a higher operating speed under a lower power supply (1xVDD). However, the...
167
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ESANN
2008
15 years 7 months ago
2008
Petri net faulty models are useful for reliability analysis and fault diagnosis of discrete event systems. Such models are difficult to work out as long as they must be computed ac...
184
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IEEECIT
2006
IEEE
16 years 9 days ago
2006
IEEE
This paper argues about the partitioning in hardware/software co-design and suggests the methodology applying extreme programming to complement the co-design. This approach, contr...
147
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
The advent of nanometer feature sizes in silicon fabrication has triggered a number of new design challenges for computer designers. These challenges include design complexity and...
162
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...