Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will so...
David Fick, Andrew DeOrio, Gregory K. Chen, Valeri...
The distributed data storage on unreliable devices, connected by a short-range radio network is analyzed. Failing devices incur loss of data. To prevent the loss, the data is spli...
The Object-Oriented Petri Nets (OOPN) based integrated solution to a grid-based application system modeling and enacting is proposed in this paper for simplifying designs and devel...
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
The UpRight library seeks to make Byzantine fault tolerance (BFT) a simple and viable alternative to crash fault tolerance for a range of cluster services. We demonstrate UpRight ...
Allen Clement, Manos Kapritsos, Sangmin Lee, Yang ...